Interview Questions
Micron
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Interview process
- 1Recruiter screen
Background and fit
- 2Technical phone screen
DFT/validation or process fundamentals
- 3Onsite: test & yield
Test flows, failure analysis, yield reasoning
- 4Onsite: debug
Structured debug and trade-offs
- 5Hiring manager & behavioral
STAR stories, project deep-dive, team fit and salary discussion
Free sample questions
3 freeWhat does test compression (e.g., EDT) buy you, and what is the trade-off?
Compression drives many internal scan chains from a few external channels via a decompressor, and compacts responses via a compactor — cutting test data volume and test time by 10–100×. The trade-off is reduced observability from aggregation (X-masking needed), added logic, and some coverage/diagnosis complexity.
Compression ratio vs coverage/diagnosis is the classic DFT trade discussion.
Differentiate a false path from a multicycle path in STA, with an example of each.
A false path is a topological path that never propagates a real transition of interest (e.g., a path between two asynchronous clock domains, or a test-only path) — it's excluded from timing. A multicycle path is real but is allowed more than one clock cycle to propagate (e.g., a slow datapath whose result is captured every 2 cycles), so setup is relaxed to N cycles.
A common trap is setting a setup multicycle without the corresponding hold adjustment.
The stuck-at fault model assumes a faulty node is:
- Randomly toggling
- Permanently held at logic 0 or logic 1
- Slow to transition
- Shorted to a neighbor
Stuck-at-0 / stuck-at-1 models a node permanently tied to a logic value. It's simple and effective; transition and bridging fault models capture other defects.
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